Philips Semiconductors
Frequency Shift Keying (FSK) receiver
Preliminary specification
UAA3202M
(1) For test circuit see Fig.11.
SPECTRUM
ANALYZER
INPUT IMPEDANCE
50 Ω
TEST CIRCUIT (1)
MED902
Fig.8 Test configuration C (spurious radiation).
GENERATOR 1
50 Ω
TEST CIRCUIT (1)
SPECTRUM
ANALYZER
WITH
PROBE
MED903
(1) For test circuit see Fig.11.
Fig.9 Test configuration D (1 dB compression point).
SIGNAL
GENERATOR
TX data
1997 Aug 12
DEVICE
UNDER TEST
RX data
MASTER
CLOCK
BIT PATTERN
GENERATOR
delayed
TX data
PRESET
DELAY
INTEGRATE
AND DUMP
DATA
COMPARATOR
to error counter
BER TEST BOARD
MED904
Fig.10 BER test facility.
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