Low-Voltage, CMOS Analog
Multiplexers/Switches
_________________________________Test Circuits/Timing Diagrams (continued)
VA, VB, VC
50Ω
VCC
VCC
A
X0–X7
VCC
B
C
MAX4581
ENABLE
X
GND VEE
300Ω
VEE
VCC
VA, VB, VC
VCC
A, B, C
X0, X1, Y0,
VCC
Y1, Z0, Z1
50Ω
MAX4583
ENABLE
GND
X, Y, Z
VEE
300Ω
VEE
VEE = 0V FOR SINGLE-SUPPLY OPERATION.
TEST EACH SECTION INDIVIDUALLY.
Figure 4. Break-Before-Make Interval
VOUT
35pF
VA, VB
50Ω
V+
VA, VB, VC
0V
VX, VY, VZ
VOUT
35pF
VOUT
0V
VCC
VCC
A
X0–X3,
VCC
B
Y0–Y3
MAX4582
ENABLE
GND
X, Y
VEE
300Ω
VEE
VOUT
35pF
tR < 20ns
50%
tF < 20ns
80%
tBBM
VCC
CHANNEL
SELECT
VENABLE
50Ω
VCC
A
X_, Y_, Z_
B
C
MAX4581
MAX4582
MAX4583
ENABLE
X, Y, Z
GND VEE
VEE
VEE = 0V FOR SINGLE-SUPPLY OPERATION.
TEST EACH SECTION INDIVIDUALLY.
VOUT
CL = 1000pF
VCC
VEnable
0V
VOUT
∆ VOUT
∆ VOUT IS THE MEASURED VOLTAGE DUE TO CHARGE
TRANSFER ERROR Q WHEN THE CHANNEL TURNS OFF.
Q = ∆ VOUT X CL
Figure 5. Charge Injection
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