MC33910BACR2 データシートの表示（PDF） - Freescale Semiconductor
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MC33910BACR2 Datasheet PDF : 90 Pages
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MC33910G5AC/MC3433910G5AC
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 4. Static Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ≤ VSUP ≤ 18 V, -40°C ≤ TA ≤ 125°C for the 33910 and -40°C ≤ TA ≤ 85°C for the
34910, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal
conditions, unless otherwise noted.
Characteristic
WINDOW WATCHDOG CONFIGURATION PIN (WDCONF)(34)
Symbol
Min
Typ
Max
Unit
External Resistor Range
REXT
20
–
200
kΩ
Watchdog Period Accuracy with External Resistor (Excluding Resistor
Accuracy)(35)
WDACC
-15
–
15
%
ANALOG MULTIPLEXER
Temperature Sense Analog Output Voltage
TA = -40°C
TA = 25°C
TA = 125°C
VADOUT0_TEMP
V
2.0
-
2.8
2.8
3.0
3.6
3.6
4.6
Temperature Sense Analog Output Voltage per characterization(36)
VADOUT0_25
3.1
3.15
3.2
V
TA = 25°C
Internal Chip Temperature Sense Gain
Internal Chip Temperature Sense Gain per characterization at 3
temperatures(36) See Figure 16, Temperature Sense Gain
STTOV
9.0
10.5
12
mV/K
STTOV_3T
9.9
10.2
10.5
mV/K
VSENSE Input Divider Ratio (RATIOVSENSE = VVSENSE / VADOUT0)
RATIOVSENSE
5.5 V < VSUP < 27 V
5.0
5.25
5.5
VSENSE Input Divider Ratio (RATIOVSENSE=Vsense/Vadout0) per
characterization(36)
5.5 <Vsup< 27 V
RATIOVSENSECZ
5.15
5.25
5.35
VSENSE Output Related Offset
VSENSE Output Related Offset per characterization(36)
OFFSETVSENSE
mV
-30
-10
30
OFFSETVSENSE
mV
_CZ
-30
-12.6
0
ANALOG OUTPUT (ADOUT0)
Maximum Output Voltage
-5.0 mA < IO < 5.0 mA
Minimum Output Voltage
-5.0 mA < IO < 5.0 mA
VOUT_MAX
V
VDD -0.35
–
VDD
VOUT_MIN
0.0
V
–
0.35
RXD OUTPUT PIN (LIN PHYSICAL LAYER) (RXD)
Low-state Output Voltage
IOUT = 1.5 mA
VOL
V
0.0
–
0.8
High-state Output Voltage
IOUT = -250 µA
VOH
V
VDD -0.8
–
VDD
Notes
34. For VSUP 4.7 to 18 V
35. Watchdog timing period calculation formula: tPWD [ms] = [0.466 * (REXT - 20)] + 10 with (REXT in kΩ)
36. These limits have been defined after laboratory characterization on 3 lots and 30 samples. These tighten limits could not be guaranteed
by production test.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33910
13
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