MC33910BACR2 データシートの表示（PDF） - Freescale Semiconductor

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MC33910BACR2

LIN System Basis Chip with High Side Drivers

Freescale Semiconductor 

ELECTRICAL CHARACTERISTICS

TIMING DIAGRAMS

MC33910G5AC/MC3433910G5AC

TIMING DIAGRAMS

33910

LIN

PGND LGND AGND

1.0 nF

TRANSIENT PULSE

GENERATOR

(NOTE)

GND

Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.

Figure 4. Test Circuit for Transient Test Pulses (LIN)

33910

1.0 nF

L1

10 kΩ

PGND LGND AGND

Transient Pulse

Generator

(Note)

GND

Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b,.

Figure 5. Test Circuit for Transient Test Pulses (L1)

VSUP

TXD

RXD

R0

LIN

R0 AND C0 COMBINATIONS:

• 1.0 KΩ and 1.0 nF

C0

• 660 Ω and 6.8 nF

• 500 Ω and 10 nF

Figure 6. Test Circuit for LIN Timing Measurements

33910

20

Analog Integrated Circuit Device Data

Freescale Semiconductor

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