MX26L6420
ERASE AND PROGRAMMING PERFORMANCE(1)
PARAMETER
Chip Erase Time
Word Programming Time
Chip Programming Time
Accelerated Word Program Time
Erase/Program Cycles
MIN.
100
LIMITS
TYP.(2)
150
30
140
7
MAX.
300
350
250
210
UNITS
sec
us
sec
us
Cycles
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25°C,3.3V. Additionally programming typicals assume checkerboard pattern.
LATCHUP CHARACTERISTICS
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
Current
Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time.
MIN.
-1.0V
-1.0V
-100mA
MAX.
13.5V
Vcc + 1.0V
+100mA
CAPACITANCE TA=0°C to 70°C, VCC=2.7V~3.6V
Parameter Symbol
CIN
COUT
CIN2
Parameter Description
Input Capacitance
Output Capacitance
Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA=25°C, f=1.0MHz
Test Set
VIN=0
VOUT=0
VIN=0
DATA RETENTION
Parameter
Minimum Pattern Data Retention Time
Test Conditions
150
125
TYP
MAX UNIT
6
7.5
pF
8.5
12
pF
7.5
9
pF
Min
Unit
10
Years
20
Years
P/N:PM0823
REV. 0.5, JAN. 29, 2002
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