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OR4E10

ORCA® Series 4 Field-Programmable Gate Arrays

Agere -> LSI Corporation

OR4E10 Datasheet PDF : 124 Pages

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Preliminary Data Sheet

December 2000

ORCA Series 4 FPGAs

Special Function Blocks (continued)

The external test (EXTEST) instruction allows the inter-

connections between ICs in a system to be tested for

opens and stuck-at faults. If an EXTEST instruction is

performed for the system shown in Figure 25, the con-

nections between U1 and U2 (shown by nets a, b,

and c) can be tested by driving a value onto the given

nets from one device and then determining whether this

same value is seen at the other device. This is deter-

mined by shifting 2 bits of data for each pin (one for the

output value and one for the 3-state value) through the

BSR until each one aligns to the appropriate pin. Then,

based upon the value of the 3-state signal, either the

I/O pad is driven to the value given in the BSR, or the

BSR is updated with the input value from the I/O pad,

which allows it to be shifted out TDO.

The SAMPLE and PRELOAD instructions are useful for

system debugging and fault diagnosis by allowing the

data at the FPGA’s I/Os to be observed during normal

operation or written during test operation. The data for

all of the I/Os is captured simultaneously into the BSR,

allowing them to be shifted-out TDO to the test host.

Since each I/O buffer in the PIOs is bidirectional, two

pieces of data are captured for each I/O pad: the value

at the I/O pad and the value of the 3-state control sig-

nal. For preload operation, data is written from the BSR

to all of the I/Os simultaneously.

There are six ORCA-defined instructions. The PLC

scan rings 1, 2, and 3 (PSR1, PSR2, PSR3) allow user-

defined internal scan paths using the PLC latches/FFs

and routing interface. The RAM_Write Enable

(RAM_W) instruction allows the user to serially config-

ure the FPGA through TDI. The RAM_Read Enable

(RAM_R) allows the user to read back RAM contents

on TDO after configuration. The IDCODE instruction

allows the user to capture a 32-bit identification code

that is unique to each device and serially output it at

TDO. The IDCODE format is shown in Table 23.

An optional IEEE 1149.3 instruction RUNBIST has

been implemented. This instruction is used to invoke

the built-in self-test (BIST) of regular structures like

RAMs, ROMs, FIFOs, etc., and the surrounding RAN-

DOM logic in the circuit.

Also implemented in Series 4 devices is the IEEE

1532/D1 standards for in-system configuration for pro-

grammable logic devices. Included are four mandatory

and two optional instructions defined in the standards.

ISC_ENABLE, ISC_PROGRAM, ISC_NOOP, and

ISC_DISABLE are the four mandatory instructions.

ISC_ENABLE initializes the devices for all subsequent

ISC instructions. The ISC_PROGRAM instruction is

similar to the RAM_WRITE instruction implemented in

all ORCA devices where the user must monitor the

PINITN pin for a high indicating the end of initialization

and a successful configuration can be started. The

ISC_PROGRAM instruction is used to program the

configuration memory through a dedicated ISC_Pdata

gramming multiple devices in parallel. During this

mode, TDI and TDO behave like BYPASS. The data

shifted through TDI is shifted out through TDO. How-

ever, the output pins remain in control of the BSR,

unlike BYPASS where they are driven by the system

logic. The ISC_DISABLE is used upon completion of

the ISC programming. No new ISC instructions will be

operable without another ISC_ENABLE instruction.

Optional 1532/D1 instructions include

ISC_PROGRAM_USERCODE. When this instruction

is loaded, the user shifts all 32 bits of a user-defined ID

(LSB first) through TDI. This overwrites any ID previ-

ously loaded into the ID register. This ID can then be

read back through the USERCODE instruction defined

in IEEE 1149.2.

ISC_READ is similar to the ORCA RAM_Read instruc-

tion which allows the user to read back the configura-

tion RAM contents serially out on TDO. Both must

monitor the PDONE signal to determine weather or not

configuration is completed. ISC_READ used a 1-bit

the configuration memory. The readback data is

clocked into the ISC_READ data register and then

clocked out TDO on the falling edge or TCK.

Table 23. Series 4E Boundary-Scan Vendor-ID Codes

Device

OR4E2

OR4E4

OR4E6

OR4E10

OR4E14

Version (4-bit)

0000

Part* (10-bit)

0011100000

0001010000

0000110000

0011110000

0010001000

Family (6-bit)

001000

* PLC array size of FPGA, reverse bit order.

Note: Table assumes version 0.

Lucent Technologies Inc.

Manufacturer (11-bit)

00000011101

LSB (1-bit)

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