MA31755 データシートの表示（PDF） - Dynex Semiconductor

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MA31755

16-Bit Feedthrough Error Detection & Correction Unit (EDAC)

Dynex Semiconductor 

MA31755

8. RADIATION TOLERANCE

8.1 TOTAL DOSE RADIATION TESTING

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

Dynex Semiconductor can provide radiation testing

compliant with Mil-Std-883 test method 1019, Ionizing

Radiation (Total Dose).

Total Dose (Function to specification)*

5x105 Rad(Si)

Transient Upset (Stored data loss)

1x1011 Rad(Si)/sec

Transient Upset (Survivability)

>1x1012 Rad(Si)/sec

Neutron Hardness (Function to specification) >1x1015 n/cm2

Single Event Upset**

<1x10-10 Errors/bit day

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 19: Radiation Hardness Parameters

9. ORDERING INFORMATION

Unique Circuit Designator

Radiation Tolerance

S Radiation Hard Processing

R 100 kRads (Si) Guaranteed

Q 300 kRads (Si) Guaranteed

Package Type

A Pin Grid Array

F Flatpack (Solder Seal)

MAx31755xxxxx

QA/QCI Process

(See Section 9 Part 4)

Test Process

(See Section 9 Part 3)

Assembly Process

(See Section 9 Part 2)

For details of reliability, QA/QC, test and assembly

options, see ‘Manufacturing Capability and Quality

Assurance Standards’ Section 9.

Reliability Level

L Rel 0

C Rel 1

D Rel 2

E Rel 3/4/5/STACK

B Class B

S Class S

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