SST31LF021E(2001) データシートの表示（PDF） - Silicon Storage Technology

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SST31LF021E
(Rev.:2001)

2 Mbit Flash + 1 Mbit SRAM ComboMemory

Silicon Storage Technology 

2 Mbit Flash + 1 Mbit SRAM ComboMemory

SST31LF021 / SST31LF021E

Data Sheet

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

392 ILL F11.1

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

FIGURE 14: AC INPUT/OUTPUT REFERENCE WAVEFORMS

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

392 ILL F12.1

FIGURE 15: A TEST LOAD EXAMPLE

TO TESTER

CL

©2001 Silicon Storage Technology, Inc.

17

S71137-03-000 10/01 392

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