28F002BX-T データシートの表示（PDF） - Intel

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28F002BX-T

2-MBIT (128K x 16, 256K x 8) BOOT BLOCK FLASH MEMORY FAMILY

Intel 

28F200BX-T B 28F002BX-T B

Revision History

Number Description

-002

Removed b70 speed bin

Integrated b70 characteristics into b60 speed bin

Added Extended Temperature characteristics

Modified BYTE Timing Diagram

Improved tPHQV RP High to Output Delay and tPHEL RP

specifications

High Recovery to CE

going low

-003

PWD changed to RP for JEDEC standardization compatibility

Combined VCC Read current for 28F200BX Word-wide mode and Byte-wide mode and

28F002BX Byte-wide mode in DC Characteristics tables

Change IPPS current spec from g10 mA to g15 mA in DC Characteristics tables

Improved ICCR and ICCW in DC Characteristics Extended Temperature Operation table

Improved tAVAV tAVQV tELQV tGLQV tEHQZ tGHQZ tFHQV and tFLQZ specifications for

Extended Temperature Operations AC Characteristics Read and Write Operations

-004

Added specifications for 120 ns access time product version 28F200BX-120 and

28F002BX-120

Included permanent change on write timing parameters for -80 ns product versions Write

pulse width (tWP and tCP) increases from 50 ns to 60 ns Write pulse width high (tWPH and

tCPH) decreases from 30 ns to 20 ns Total write cycle time (tWC) remains unchanged

Added ICCR test condition note for typical frequency value in DC characteristics table

Added IOH CMOS specification

Added 28F400BX interface to Intel386TMEX Embedded Processor block diagram

Added description of how to upgrade to SmartVoltage Boot Block products

-005 Added references to input rise fall times

48

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