ADM1029ARQZ-R7(2012) データシートの表示（PDF） - ON Semiconductor
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ADM1029ARQZ-R7
(Rev.:2012)
(Rev.:2012)
ON Semiconductor
ADM1029ARQZ-R7 Datasheet PDF : 50 Pages
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ADM1029
Table 4. ELECTRICAL CHARACTERISTICS (TA = TMIN to TMAX, VCC = VMIN to VMAX, unless otherwise noted. (Note 1 and 2))
Parameter
Test Conditions/Comments
Min
Typ
Max
Unit
SERIAL BUS TIMING (Note 5)
Bus Free Time, tBUF
4.7
−
−
ms
Start Setup Time, tSU; STA
4.7
−
−
ms
Start Hold Time, tHD; STA
4.0
−
−
ms
Stop Condition Setup Time, tSU; STO
4.0
−
−
ms
SCL Low Time, tLOW
1.3
−
−
ms
SCL High Time, tHIGH
4.0
−
50
ms
SCL, SDA Rise Time, tR
−
−
1,000
ns
SCL, SDA Fall Time, tF
−
−
300
ns
Data Setup Time, tSU; DAT
250
−
−
ns
Data Hold Time, tHD; DAT
300
−
−
ns
1. All voltages are measured with respect to GND, unless otherwise specified.
2. Typicals are at TA = 25C and represent the most likely parametric norm. Shutdown current typ is measured with VCC = 3.3 V.
3. Total unadjusted error (TUE) includes offset, gain, and linearity errors of the ADC, multiplexer.
4. The total fan count is based on two pulses per revolution of the fan tachometer output.
5. Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.1 V for a rising edge.
NOTE: Specifications subject to change without notice.
SCL
SDA
tBUF
P
S
t LOW
tR
tHD; STA
tHD; DAT
tF
tHIGH
tSU; DAT
t HD; STA
tSU; STA
S
Figure 2. Serial Bus Timing Diagram
tSU; STO
P
TYPICAL PERFORMANCE CHARACTERISTICS
15
10
5
DXP TO GND
0
−5
DXP TO VCC (3.3 V)
−10
−15
−20
0
3.3
10
30
100
LEAKAGE RESISTANCE (MW)
Figure 3. Remote Temperature Error vs. PC Board
Track Resistance
110
100
90
80
70
60
50
40
30
20
10
0
0
10 20
30 40 50 60
70 80
90 100 110
MEASURED TEMPERATURE
Figure 4. Pentium) III Temperature Measurement
vs. ADM1029 Reading
http://onsemi.com
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