M29F002 データシートの表示（PDF） - Advanced Micro Devices

部品番号

コンポーネント説明

メーカー

M29F002

2 Megabit (256 K x 8-Bit) CMOS 5.0 Volt-only Boot Sector Flash Memory

Advanced Micro Devices 

PRELIMINARY

TEST CONDITIONS

5.0 V

Device

Under

Test

CL

6.2 kΩ

2.7 kΩ

Note: Diodes are IN3064 or equivalent

Figure 8. Test Setup

20818C-11

Table 7. Test Specifications

Test Condition

All

-55

others Unit

Output Load

1 TTL gate

Output Load Capacitance, CL

(including jig capacitance)

30

100

pF

Input Rise and Fall Times

5

20

ns

Input Pulse Levels

0.0–3.0 0.45–2.4 V

Input timing measurement

reference levels

1.5 0.8, 2.0 V

Output timing measurement

reference levels

1.5 0.8, 2.0 V

KEY TO SWITCHING WAVEFORMS

WAVEFORM

INPUTS

Steady

OUTPUTS

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High Z)

KS000010-PAL

Am29F002/Am29F002N

23

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