CY62148 データシートの表示（PDF） - Cypress Semiconductor
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CY62148 Datasheet PDF : 7 Pages
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PRELIMINARY
CY62148
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC to Relative GND[1] .... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State[1] .....................................–0.5V to VCC +0.5V
Electrical Characteristics Over the Operating Range[3]
DC Input Voltage[1] ................................. –0.5V to VCC +0.5V
Current into Outputs (LOW) ........................................ 20 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature[2]
0°C to +70°C
–40°C to +85°C
VCC
5V ± 10%
5V ± 10%
Parameter
Description
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[1]
IIX
Input Load Current
IOZ
Output Leakage Current
ICC
VCC Operating
Supply Current
ISB1
Automatic CE
Power-Down Current
— TTL Inputs
ISB2
Automatic CE
Power-Down Current
— CMOS Inputs
Shaded areas contain advance information
Test Conditions
VCC = Min., IOH = –1 mA
VCC = Min., IOL = 2.1 mA
GND ≤ VI ≤ VCC
GND ≤ VI ≤ VCC, Output Disabled
VCC = Max.,
IOUT = 0 mA,
f = fMAX = 1/tRC
Com’l
Max. VCC, CE ≥ VIH
VIN ≥ VIH or
VIN ≤ VIL, f = fMAX
Com’l
Max. VCC,
CE ≥ VCC – 0.3V,
VIN ≥ VCC – 0.3V,
or VIN ≤ 0.3V, f=0
Com’l
L
62148–55 62148–70
Min. Max. Min. Max. Unit
2.4
2.4
V
0.4
0.4 V
2.2 VCC+ 2.2 VCC+ V
0.3
0.3
–0.3 0.8 –0.3 0.8 V
–1 +1 –1 +1 µA
–5 +5 –5 +5 µA
120
120 mA
15
15 mA
2
2 mA
500
500 µA
Capacitance[5]
Parameter
Description
Test Conditions
Max.
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
10
COUT
Output Capacitance
VCC = 5.0V
10
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
5. Tested initially and after any design or process changes that may affect these parameters.
Unit
pF
pF
2
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