DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

M36W432BGZAT データシートの表示(PDF) - STMicroelectronics

部品番号
コンポーネント説明
メーカー
M36W432BGZAT Datasheet PDF : 66 Pages
First Prev 31 32 33 34 35 36 37 38 39 40 Next Last
M36W432TG, M36W432BG
SRAM OPERATIONS
There are five standard operations that control the
SRAM component. These are Bus Read, Bus
Write, Standby/Power-down, Data Retention and
Output Disable. A summary is shown in Table 2,
Main Operation Modes
Read. Read operations are used to output the
contents of the SRAM Array. The SRAM is in Read
mode whenever Write Enable, WS, is at VIH, Out-
put Enable, GS, is at VIL, Chip Enable, E1S, is at
VIL, Chip Enable, E2S, is at VIH, and Byte Enable
inputs, UBS and LBS are at VIL.
Valid data will be available on the output pins after
a time of tAVQV after the last stable address. If the
Chip Enable or Output Enable access times are
not met, data access will be measured from the
limiting parameter (tE1LQV, tE2HQV, or tGLQV) rath-
er than the address. Data out may be indetermi-
nate at tE1LQX, tE2HQX and tGLQX, but data lines
will always be valid at tAVQV (see Table 23, Table
23, Figures 17 and 18, SRAM Read AC Character-
istics).
Write. Write operations are used to write data to
the SRAM. The SRAM is in Write mode whenever
WS and E1S are at VIL, and E2S is at VIH. Either
the Chip Enable inputs, E1S and E2S, or the Write
Enable input, WS, must be deasserted during ad-
dress transitions for subsequent write cycles.
A Write operation is initiated when E1S is at VIL,
E2S is at VIH and WS is at VIL. The data is latched
on the falling edge of E1S, the rising edge of E2S
or the falling edge of WS, whichever occurs last.
The Write cycle is terminated on the rising edge of
E1S, the rising edge of WS or the falling edge of
E2S, whichever occurs first.
If the Output is enabled (E1S=VIL, E2S=VIH and
GS=VIL), then WS will return the outputs to high im-
pedance within tWLQZ of its falling edge. Care must
be taken to avoid bus contention in this type of op-
eration. The Data input must be valid for tDVWH be-
fore the rising edge of Write Enable, for tDVE1H
before the rising edge of E1S or for tDVE2L before
the falling edge of E2S, whichever occurs first, and
remain valid for tWHDX, tE1HAX or tE2LAX (see Table
24, SRAM Write AC Characteristics, Figures 20,
21, 22 and 23).
Standby/Power-Down. The SRAM component
has a chip enabled power-down feature which in-
vokes an automatic standby mode (see Table 23,
SRAM Read AC Characteristics, Figure 19, SRAM
Standby AC Waveforms). The SRAM is in Standby
mode whenever either Chip Enable is deasserted,
E1S at VIH or E2S at VIL. It is also possible when
UBS and LBS are at VIH.
Data Retention. The SRAM data retention per-
formance as VDDS goes down to VDR are de-
scribed in Table 25, SRAM Low VDDS Data
Retention Characteristic, and Figure 24, SRAM
Low VDDS Data Retention AC Waveforms, E1S or
UBS / LBS Controlled. In E1S controlled data reten-
tion mode, the minimum standby current mode is
entered when E1S VDDS – 0.2V and E2S 0.2V
or E2S VDDS – 0.2V. In E2S controlled data re-
tention mode, minimum standby current mode is
entered when E2S 0.2V.
Output Disable. The data outputs are high im-
pedance when the Output Enable, GS, is at VIH
with Write Enable, WS, at VIH.
40/66

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]