M28W320 データシートの表示（PDF） - STMicroelectronics

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M28W320

32 Mbit (2Mb x16, Boot Block) 3V Supply Flash Memory

STMicroelectronics 

M28W320FCT, M28W320FCB

Figure 7. AC Measurement Load Circuit

VDDQ

VDDQ

VDD

0.1µF

0.1µF

DEVICE

UNDER

TEST

25kΩ

CL

25kΩ

DC and AC parameters

CL includes JIG capacitance

AI00609C

Table 14. Capacitance(1)

Symbol

Parameter

Test Condition

Min

CIN

Input Capacitance

COUT

Output Capacitance

1. Sampled only, not 100% tested.

VIN = 0V

VOUT = 0V

Table 15. DC Characteristics

Symbol

Parameter

Test Condition

Min

ILI Input Leakage Current

0V≤ VIN ≤ VDDQ

ILO Output Leakage Current

0V≤ VOUT ≤VDDQ

IDD Supply Current (Read)

E = VSS, G = VIH, f = 5MHz

IDD1

Supply Current (Stand-by or

Automatic Stand-by)

E = VDDQ ± 0.2V,

RP = VDDQ ± 0.2V

IDD2

Supply Current

(Reset)

RP = VSS ± 0.2V

IDD3 Supply Current (Program)

IDD4 Supply Current (Erase)

Supply Current

IDD5 (Program/Erase Suspend)

Program in progress

VPP = 12V ± 5%

Program in progress

VPP = VDD

Erase in progress

VPP = 12V ± 5%

Erase in progress

VPP = VDD

E = VDDQ ± 0.2V,

Erase suspended

IPP

Program Current

(Read or Stand-by)

VPP > VDD

Max

Unit

6

pF

12

pF

Typ

Max Unit

±1

µA

±10

µA

9

18

mA

15

50

µA

15

50

µA

5

10

mA

10

20

mA

5

20

mA

10

20

mA

15

50

µA

400

µA

33/69

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