CY7C1011CV33-10BVC データシートの表示（PDF） - Cypress Semiconductor

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CY7C1011CV33-10BVC

128K x 16 Static RAM

Cypress Semiconductor 

CY7C1011CV33

Maximum Ratings

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Storage Temperature .................................–65°C to +150°C

DC Input Voltage[2] ................................ –0.5V to VCC + 0.5V

Current into Outputs (LOW)......................................... 20 mA

Operating Range

Ambient Temperature with

Power Applied............................................. –55°C to +125°C

Supply Voltage on VCC to Relative GND[2] .... –0.5V to +4.6V

DC Voltage Applied to Outputs

in High-Z State[2] ....................................–0.5V to VCC + 0.5V

Range

Commercial

Industrial

Ambient

Temperature

0°C to +70°C

–40°C to +85°C

VCC

3.3V ± 0.3V

DC Electrical Characteristics Over the Operating Range

Parameter

Description

VOH

Output HIGH Voltage

VOL

Output LOW Voltage

VIH

Input HIGH Voltage

Test Conditions

VCC = Min.,

IOH = –4.0 mA

VCC = Min.,

IOL = 8.0 mA

VIL

Input LOW Voltage[1]

IIX

Input Load Current

GND < VI < VCC

IOZ

Output Leakage Current GND < VOUT < VCC,

Output Disabled

ICC

VCC Operating

Supply Current

VCC = Max., f = fMAX =

1/tRC

ISB1

Automatic CE

Power-down Current

—TTL Inputs

ISB2

Automatic CE

Power-down Current

—CMOS Inputs

Capacitance[2]

Max. VCC, CE > VIH

VIN > VIH or

VIN < VIL, f = fMAX

Max. VCC,

CE > VCC – 0.3V,

VIN > VCC – 0.3V,

or VIN < 0.3V, f = 0

Com’l

Ind’l

Com’l/

Ind’l

-10

Min. Max.

2.4

0.4

2.0 VCC

+ 0.3

–0.3 0.8

–1 +1

–1 +1

90

100

40

10

-12

Min. Max.

2.4

0.4

2.0

–0.3

–1

–1

VCC

+ 0.3

0.8

+1

+1

85

95

40

10

-15

Min. Max. Unit

2.4

V

0.4 V

2.0 VCC V

+ 0.3

–0.3 0.8 V

–1 +1 µA

–1 +1 µA

80 mA

90 mA

40 mA

10 mA

Parameter

Description

Test Conditions

Max.

Unit

CIN

Input Capacitance

TA = 25°C, f = 1 MHz, VCC = 3.3V

8

pF

COUT

I/O Capacitance

8

pF

Notes:

1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.

2. Tested initially and after any design or process changes that may affect these parameters.

Document #: 38-05232 Rev. *B

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