DS1023-025 データシートの表示（PDF） - Dallas Semiconductor -> Maxim Integrated

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DS1023-025

8-Bit Programmable Timing Element

Dallas Semiconductor -> Maxim Integrated 

DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 8

DS1023

TEST SETUP DESCRIPTION

Figure 8 illustrates the hardware configuration used for measuring the timing parameters of the DS1023.

The input waveform is produced by a precision pulse generator under software control. Time delays are

measured by a time interval counter (20 ps resolution) connected to the output. The DS1023 serial and

parallel ports are controlled by interfaces to a central computer. All measurements are fully automated

with each instrument controlled by the computer over an IEEE 488 bus.

TEST CONDITIONS

INPUT:

Ambient Temperature:

Supply Voltage (VCC):

Input Pulse:

Source Impedance:

Rise and Fall Time:

Pulse Width:

Period:

25°C ±=3°C

5.0V ±=0.1V

High = 3.0V ±=0.1V

Low = 0.0V ±=0.1V

50 ohms max.

3.0 ns max.

(measured between

0.6V and 2.4V)

500 ns

1 µs

NOTE: Above conditions are for test only and do not restrict the operation of the device under other data

sheet conditions.

OUTPUT:

Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input

signal and the 1.5V level of the corresponding edge of the output.

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