DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

RF2174 データシートの表示(PDF) - RF Micro Devices

部品番号
コンポーネント説明
メーカー
RF2174
RFMD
RF Micro Devices RFMD
RF2174 Datasheet PDF : 12 Pages
First Prev 11 12
RF2174
2
Typical Test Setup
Power Supply
V- S- S+ V+
Preliminary
RF Generator
3dB
Spectrum
Analyzer
10dB/5W
Pulse
Generator
Buffer
x1 OpAmp
A buffer amplifier is recommended because the current into
the VAPC changes with voltage. As an alternative, the
voltage may be monitored with an oscilloscope.
Notes about testing the RF2174
The test setup shown above includes two attenuators. The 3dB pad at the input is to minimize the effects that the
switching of the input impedance of the PA has on the signal generator. When VAPC is switched quickly, the resulting
input impedance change can cause the signal generator to vary its output signal, either in output level or in frequency.
Instead of an attenuator an isolator may also be used. The attenuator at the output is to prevent damage to the spec-
trum analyzer, and should be able to handle the power.
It is important not to exceed the rated supply current and output power. When testing the device at higher than nominal
supply voltage, the VAPC should be adjusted to avoid the output power exceeding +36dBm. During load-pull testing at
the output it is important to monitor the forward power through a directional coupler. The forward power should not
exceed +36dBm, and VAPC needs to be adjusted accordingly. This simulates the behavior for the power control loop in
this respect. To avoid damage, it is recommended to set the power supply to limiting the current during the burst, not to
exceed the maximum current rating.
2-242
Rev A6 010720

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]