ML2264CCP データシートの表示（PDF） - Micro Linear Corporation

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ML2264CCP

4-Channel High-Speed 8-Bit A/D Converter with T/H (S/H)

Micro Linear Corporation 

ML2264

ELECTRICAL CHARACTERISTICS (Continued)

Unless otherwise specified, TA = TMIN to TMAX, VCC = +VREF = 5V ± 5%, and –VREF = GND, and timing measured at 1.4V,

CL = 100pF. (Note 1)

ML2264XCX

PARAMETER

NOTES

CONDITIONS

TYP

MIN (NOTE 3) MAX

UNITS

AC Performance Write-Read Mode (Pin 5 = 5V) Figures 5 and 6 (Continued)

tINTL, Internal Comparison

Time — WR Rising Edge

to INT Low

4, 9 tRD > tINTL

620

ns

tACC2, Data Access Time

— RD to Data Valid

4

tRD > tINTL

0

50

ns

tDH, Data Hold Time —

RD Rising Edge to Data

High Impedance State

tINTH, RD to INT Delay

tP, Delay Time Between

Conversions — INT Low

to WR Low

tIHWR, WR to INT Delay

tID, INTØ to Data Valid Delay

5, 9 Figure 3

4, 9

4, 9 Sample & Hold Mode,

SH/TH = VCC

Track & Hold Mode,

SH/TH = GND

4, 9 Standalone Mode

4, 9 Standalone Mode

0

50

ns

0

65

ns

300

ns

240

ns

0

90

ns

0

20

ns

Note 1:

Note 2:

Note 3:

Note 4:

Note 5:

Note 6:

Note 7:

Note 8:

Note 9:

Limits are guaranteed by 100% testing, sampling, or correlation with worst-case test conditions.

When the voltage at any pin exceeds the power supply rails (VIN < GND or VIN > VCC) the absolute value of current at that pin should be limited to 25mA or less.

Typicals are parametric norm at 25°C.

Parameter guaranteed and 100% production tested.

Parameter guaranteed. Parameters not 100% tested are not in outgoing quality level calculation.

Total unadjusted error includes offset, full scale, linearity, sample and hold, and multiplexer errors. Total unadjusted error is tested at the minimum specified times

for WR, RD, tR1, and tP. For example, for the ML2264XCX in the sample and hold mode, WR/RD mode: tWR = 190ns, tRD = 275ns with a frequency of 1.000MHz

(cycle time of 1000ns).

For –VREF • VIN the digital output code will be 0000 0000. Two on-chip diodes are tied to the analog input which will forward conduct for analog input voltages one

diode drop below ground or one diode drop greater than the VCC supply. Be careful, during testing at low VCC levels (4.5V), as high level analog inputs (5V) can

cause this input diode to conduct — especially at elevated temperatures, and cause errors for analog inputs near full scale. The spec allows 100mV forward bias of

either diode. This means that as long as the analog VIN or VREF does not exceed the supply voltage by more than 100mV, the output code will be correct. To achieve

an absolute 0VDC to 5VDC input voltage range will therefore require a minimum supply voltage of 4.900VDC over temperature variations, initial tolerance and

loading.

Conversion time, write-read mode = tWR + tRD + tRI.

Defined from the time an output crosses 0.8V or 2.4V.

6

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