ICS85105AGI データシートの表示（PDF） - Integrated Device Technology

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ICS85105AGI

LOW SKEW, 1-TO-5, DIFFERENTIAL/LVCMOS-TO-0.7V HCSL FANOUT BUFFER

Integrated Device Technology 

ICS85105I

LOW SKEW, 1-TO-5, DIFFERENTIAL/LVCMOS-TO-0.7V HCSL FANOUT BUFFER

3.3V±10%

PARAMETER MEASUREMENT INFORMATION

3.3V±10%

SCOPE

VDD

50Ω

HCSL

50Ω

GND

475Ω

IREF

0V

This load condition is used for I , tsk(o), t , and tjit measurements.

DD

PD

HCSL OUTPUT LOAD AC TEST CIRCUIT

VDD

nCLK0

V

PP

CLK0

Cross Points

V

CMR

GND

DIFFERENTIAL INPUT LEVELS

nQx

Qx

nQy

Qy

t sk(o)

OUTPUT SKEW (DIFFERENTIAL INPUT)

CLK1

nQ0:nQ4

Q0:Q4

tPD

PROPAGATION DELAY (LVCMOS INPUT)

VDD

33Ω

HCSL

33Ω

GND

475Ω

IREF

0V

50Ω

49.9Ω

50Ω

49.9Ω

Qx

2pF

nQx

2pF

HCSL OUTPUT LOAD AC TEST CIRCUIT

PART 1

nQx

Qx

PART 2

nQy

Qy

t sk(pp)

PART-TO-PART SKEW

nCLK0

CLK0

nQ0:nQ4

Q0:Q4

tPD

PROPAGATION DELAY (DIFFERENTIAL INPUTS)

Rise Edge Rate

Fall Edge Rate

+150mV

0.0V

-150mV

Q - nQ

DIFFERENTIAL MEASUREMENT POINTS FOR RISE/FALL TIME

IDT™ / ICS™ 0.7V HCSL FANOUT BUFFER

7

ICS85105AGI REV. A JUNE 5, 2008

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