IDT49C460 データシートの表示（PDF） - Integrated Device Technology

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IDT49C460

32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT

Integrated Device Technology 

IDT49C460/A/B/C/D/E

32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT

TEST LOAD CIRCUIT

VCC

MILITARY AND COMMERCIAL TEMPERATURE RANGES

+ 7.0V

VIN

Pulse

Generator

VOUT

D.U.T.

RT

50pF

CL

500Ω

500Ω

DEFINITIONS:

CL = Load capacitance: includes jig and probe capacitance

RL = Termination resistance: should be equal to ZOUT of the Pulse Generator

Figure 7.

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AC TEST CONDITIONS

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

1V/ns

1.5V

1.5V

See Figure 7

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Test

Disable Low

Enable Low

All other Tests

Switch

Closed

Open

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ORDERING INFORMATION

49C460

IDT Device Type

X

Speed

X

Package

X

Process/

Temperature

Range

11.6

BLANK

B

Commercial (0°C to + 70°C)

Military (– 55°C to + 125°C)

Compliant to MIL-STD-883, Class B

G

Pin Grid Array

J

Plastic Leaded Chip Carrier

FF

Fine Pitch Flatpack

Blank

A

B

C

D

E

Standard Speed

High-Speed

Very High-Speed

Super-High-Speed

Ultra-High Speed

Fastest Speed

49C460 32-Bit E. D. C.

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32

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