IDT71V424L(2013) データシートの表示（PDF） - Integrated Device Technology

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IDT71V424L
(Rev.:2013)

3.3V CMOS Static RAM 4 Meg (512K x 8-Bit)

Integrated Device Technology 

IDT71V424S, IDT71V424L, 3.3V CMOS Static RAM

4 Meg (512K x 8-bit)

AC Test Conditions

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

GND to 3.0V

1.5ns

1.5V

Output Reference Levels

1.5V

AC Test Load

See Figure 1, 2 and 3

3622 tbl 09

AC Test Loads

I/O

Z0 = 50Ω

+1.5V

50Ω

30pF

3622 drw 03

Figure 1. AC Test Load

Commercial and Industrial Temperature Ranges

DATAOUT

5pF*

3.3V

320Ω

350Ω

3622 drw 04

*Including jig and scope capacitance.

Figure 2. AC Test Load

(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)

7

6

ΔtAA, tACS

(Typical, ns) 5

4

3

2

1

•

•

•

•

•

•

•

8 20 40 60 80 100 120 140 160 180 200

CAPACITANCE (pF)

3622 drw 05

Figure 3. Output Capacitive Derating

6.42

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