M24C16-W M24C16-R M24C16-F
DC and AC parameters
Symbol
Table 14. DC characteristics (M24C16-R, device grade 6)
Parameter
Test conditions(1) (in addition to
those in Table 6 and Table 9)
Min.
Max. Unit
ILI
Input leakage current
(SCL, SDA)
ILO Output leakage current
VIN = VSS or VCC, device in
Standby mode
SDA in Hi-Z, external voltage
applied on SDA: VSS or VCC
-
± 2 µA
-
± 2 µA
ICC Supply current (Read)
VCC = 1.8 V, fc= 400 kHz
-
0.8 mA
ICC0 Supply current (Write)
ICC1 Standby supply current
VIL
Input low voltage
(SCL, SDA, WC)
Input high voltage
(SCL, SDA)
VIH Input high voltage
(WC)
Value overaged over tW,
VCC ≤2.5 V
Device not selected(3),
VIN = VSS or VCC, VCC = 1.8 V
2.5 V ≤ VCC
VCC < 2.5 V
VCC < 2.5 V
VCC < 2.5 V
-
1(2)
mA
-
1
µA
–0.45 0.3 VCC V
–0.45 0.25 VCC V
0.75 VCC 6.5
V
0.75 VCC VCC+ 0.6 V
VOL Output low voltage
IOL = 0.7 mA, VCC = 1.8 V
-
0.2
V
1.
If the
refer
application
to Table 13
uses the voltage range
instead of this table.
R
device
with
2.5
V
≤Vcc
≤5.5
V
and
-40
°C
<
TA
<
+85
°C,
please
2.
Characterized only (not tested in production) for devices identified by process letter T.
than 0.5 mA when writing data with an ambient temperature greater than 25 °C.
ICC0(max) is lower
3. The device is not selected after power-up, after a Read instruction (after the Stop condition), or after the
completion of the internal write cycle tW (tW is triggered by the correct decoding of a Write instruction).
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