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M54HC139D データシートの表示(PDF) - STMicroelectronics

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M54HC139D Datasheet PDF : 29 Pages
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M54HCxxx - M54HCTxxx
4
Radiation data
Radiation data
Each wafer lot is qualified at 50 krad (Si) total dose as per ESCC 22900 specification at 210
rad/hour.
The HC/HCT series is characterized under heavy Ion on 4 functions representative of the
whole series and qualified as per the results of this characterization.
Detailed results are provided in the table below:
Table 6. Radiation data
Function
Gate: 54HC08
Multiplexer 54HC157
Flip-flop 54HC273
Counter 54HC4040
Analog Mux/Demux 54HC4053
Result
SEL and SEU free for LET [ 111 MeV/mg/cm²
SEL and SEU free for LET[ 111 MeV/mg/cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 16MeV/mg/cm², σsat = 1.7x10-4 cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 34MeV/mg/cm², σsat = 4.2x10-4 cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 7MeV/mg/cm², σsat = 2.4x10-4 cm²”
Doc ID 17367 Rev 2
13/29

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