M58MR016ZC-T データシートの表示（PDF） - STMicroelectronics

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M58MR016ZC-T

16 Mbit (1Mb x16, Mux I/O, Dual Bank, Burst) 1.8V Supply Flash Memory

STMicroelectronics 

M58MR016C, M58MR016D

Table 24. AC Measurement Conditions

Input Rise and Fall Times

≤ 4ns

Input Pulse Voltages

0 to VDDQ

Input and Output Timing Ref. Voltages

VDDQ/2

Figure 8. Testing Input/Output Waveforms

VDDQ

0V

VDDQ/2

AI05235

Figure 9. AC Testing Load Circuit

VDDQ / 2

1N914

DEVICE

UNDER

TEST

3.3kΩ

OUT

CL = 30pF

CL includes JIG capacitance

AI05236

Table 25. Capacitance (1)

(TA = 25 °C, f = 1 MHz)

Symbol

Parameter

CIN

Input Capacitance

COUT

Output Capacitance

Note: 1. Sampled only, not 100% tested.

Test Condition

VIN = 0V

VOUT = 0V

Min

Max

Unit

6

pF

12

pF

28/51

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