MAX1213N データシートの表示（PDF） - Maxim Integrated

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MAX1213N

1.8V, Low-Power, 12-Bit, 170Msps ADC for Broadband Applications

Maxim Integrated 

1.8V, Low-Power, 12-Bit, 170Msps

ADC for Broadband Applications

The MAX1213N is packaged in a 68-pin QFN-EP pack-

age (package code: G6800-4), providing greater

design flexibility, increased thermal dissipation, and

optimized AC performance of the ADC. The exposed

paddle (EP) must be soldered down to AGND.

In this package, the data converter die is attached to

an EP lead frame with the back of this frame exposed

at the package bottom surface, facing the PC board

side of the package. This allows a solid attachment of

the package to the board with standard infrared (IR)

flow soldering techniques.

Thermal efficiency is one of the factors for selecting a

package with an exposed paddle for the MAX1213N.

The exposed paddle improves thermal and ensures a

solid ground connection between the ADC and the PC

board’s analog ground layer.

Considerable care must be taken when routing the digi-

tal output traces for a high-speed, high-resolution data

converter. Keep trace lengths at a minimum and place

minimal capacitive loading (less than 5pF) on any digi-

tal trace to prevent coupling to sensitive analog sec-

tions of the ADC. It is recommended running the LVDS

output traces as differential lines with 100Ω matched

impedance from the ADC to the LVDS load device.

Static Parameter Definitions

Integral Nonlinearity (INL)

Integral nonlinearity is the deviation of the values on an

actual transfer function from a straight line. This straight

line can be either a best straight-line fit or a line drawn

between the end points of the transfer function, once off-

set and gain errors have been nullified. The static lineari-

ty parameters for the MAX1213N are measured using the

histogram method with a 10MHz input frequency.

Differential Nonlinearity (DNL)

Differential nonlinearity is the difference between an

actual step width and the ideal value of 1 LSB. A DNL

error specification of less than 1 LSB guarantees no

missing codes and a monotonic transfer function. The

MAX1213N’s DNL specification is measured with the

histogram method based on a 10MHz input tone.

Dynamic Parameter Definitions

Aperture Jitter

Figure 11 shows the aperture jitter (tAJ), which is the

sample-to-sample variation in the aperture delay.

Aperture Delay

Aperture delay (tAD) is the time defined between the

rising edge of the sampling clock and the instant when

an actual sample is taken (Figure 11).

Signal-to-Noise Ratio (SNR)

For a waveform perfectly reconstructed from digital sam-

ples, the theoretical maximum SNR is the ratio of the full-

scale analog input (RMS value) to the RMS quantization

error (residual error). The ideal, theoretical minimum ana-

log-to-digital noise is caused by quantization error only

and results directly from the ADC’s resolution (N bits):

SNR[max] = 6.02 x N + 1.76

In reality, other noise sources such as thermal noise,

clock jitter, signal phase noise, and transfer function

nonlinearities also contribute to the SNR calculation and

should be considered when determining the signal-to-

noise ratio in ADC. The SNR for the MAX1213N is speci-

fied in decibels (dB), however, SNR can also be

specified in dBFS. To obtain the SNR in dBFS, simply

subtract the amplitude of the input tone (this number is

given in dBFS) at which the SNR is measured from the

SNR number in dB. For example, an ADC having an

SNR of 67dB resulting from an input tone with amplitude

-1dBFS will have an SNR of 67 - (-1) = 68dBFS.

Signal-to-Noise Plus Distortion (SINAD)

SINAD is computed by taking the ratio of the RMS sig-

nal to all spectral components excluding the fundamen-

tal and the DC offset. In the case of the MAX1213N,

SINAD is computed from a curve fit.

CLKP

CLKN

ANALOG

INPUT

tAD

tAJ

SAMPLED

DATA (T/H)

T/H TRACK

HOLD

TRACK

Figure 11. Aperture Jitter/Delay Specifications

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