MCP2551-I/P データシートの表示（PDF） - Microchip Technology

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MCP2551-I/P

High-Speed CAN Transceiver

Microchip Technology 

MCP2551

FIGURE 2-1:

TEST CIRCUIT FOR ELECTRICAL CHARACTERISTICS

TXD

VREF

RXD

30 pF

VDD

0.1µF

CANH

CAN

Transceiver

60 Ω

GND

CANL

RS

Rext

100 pF

Note: RS may be connected to VDD or GND via a load resistor depending on desired

operating mode as described in Section 1.7.3 “Supply Voltage (VDD)”.

FIGURE 2-2:

TEST CIRCUIT FOR AUTOMOTIVE TRANSIENTS

TXD

VREF

RXD

CANH 500 pF

CAN

Transceiver

Schaffner

60Ω

Generator

GND

CANL

RS

Rext

500 pF

Note:

RS may be connected to VDD or

GND via a load resistor depending

on desired operating mode as

described in Section 1.7.8 “Slope

Resistor Input (Rs)”.

The wave forms of the applied transients shall be in accordance with “ISO-7637, Part 1”, test pulses 1, 2, 3a and 3b.

FIGURE 2-3:

HYSTERESIS OF THE RECEIVER

RXD (receive data

output voltage)

VDIFF (r)(i)

0.5

hysteresis

D19

VDIFF (d)(i)

VOH

VOL

0.9

VDIFF (V)

© 2010 Microchip Technology Inc.

DS21667F-page 11

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