MCP2551-I/P データシートの表示（PDF） - Microchip Technology

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MCP2551-I/P

High-Speed CAN Transceiver

Microchip Technology 

2.0 ELECTRICAL

CHARACTERISTICS

2.1 Terms and Definitions

A number of terms are defined in ISO-11898 that are

used to describe the electrical characteristics of a CAN

transceiver device. These terms and definitions are

summarized in this section.

2.1.1 BUS VOLTAGE

VCANL and VCANH denote the voltages of the bus line

wires CANL and CANH relative to ground of each

individual CAN node.

2.1.2

COMMON MODE BUS VOLTAGE

RANGE

Boundary voltage levels of VCANL and VCANH with

respect to ground, for which proper operation will occur,

if up to the maximum number of CAN nodes are

connected to the bus.

2.1.3

DIFFERENTIAL INTERNAL

CAPACITANCE, CDIFF

(OF A CAN NODE)

Capacitance seen between CANL and CANH during

the Recessive state when the CAN node is

disconnected from the bus (see Figure 2-1).

2.1.4

DIFFERENTIAL INTERNAL

RESISTANCE, RDIFF

(OF A CAN NODE)

Resistance seen between CANL and CANH during the

Recessive state when the CAN node is disconnected

from the bus (see Figure 2-1).

MCP2551

2.1.5

DIFFERENTIAL VOLTAGE, VDIFF

(OF CAN BUS)

Differential voltage of the two-wire CAN bus, value

VDIFF = VCANH - VCANL.

2.1.6

INTERNAL CAPACITANCE, CIN

(OF A CAN NODE)

Capacitance seen between CANL (or CANH) and

ground during the Recessive state when the CAN node

is disconnected from the bus (see Figure 2-1).

2.1.7

INTERNAL RESISTANCE, RIN

(OF A CAN NODE)

Resistance seen between CANL (or CANH) and

ground during the Recessive state when the CAN node

is disconnected from the bus (see Figure 2-1).

FIGURE 2-1:

PHYSICAL LAYER

DEFINITIONS

ECU

RIN

CANL

RIN

RDIFF

CDIFF

CANH

CIN

CIN

GROUND

© 2010 Microchip Technology Inc.

DS21667F-page 7

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