MCP2551-I/P データシートの表示（PDF） - Microchip Technology

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MCP2551-I/P

High-Speed CAN Transceiver

Microchip Technology 

MCP2551

Absolute Maximum Ratings†

VDD.............................................................................................................................................................................7.0V

DC Voltage at TXD, RXD, VREF and VS ............................................................................................ -0.3V to VDD + 0.3V

DC Voltage at CANH, CANL (Note 1) .......................................................................................................... -42V to +42V

Transient Voltage on Pins 6 and 7 (Note 2) ............................................................................................. -250V to +250V

Storage temperature ...............................................................................................................................-55°C to +150°C

Operating ambient temperature ..............................................................................................................-40°C to +125°C

Virtual Junction Temperature, TVJ (Note 3).............................................................................................-40°C to +150°C

Soldering temperature of leads (10 seconds) .......................................................................................................+300°C

ESD protection on CANH and CANL pins (Note 4) ...................................................................................................6 kV

ESD protection on all other pins (Note 4) ..................................................................................................................4 kV

Note 1: Short-circuit applied when TXD is High and Low.

2: In accordance with ISO-7637.

3: In accordance with IEC 60747-1.

4: Classification A: Human Body Model.

† NOTICE: Stresses above those listed under “Maximum ratings” may cause permanent damage to the device. This

is a stress rating only and functional operation of the device at those or any other conditions above those indicated in

the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods

may affect device reliability.

DS21667F-page 8

© 2010 Microchip Technology Inc.

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