NCP512SQ25T1 データシートの表示（PDF） - ON Semiconductor
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NCP512SQ25T1 Datasheet PDF : 10 Pages
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NCP512
ELECTRICAL CHARACTERISTICS (Vin = Vout(nom.) + 1.0 V, Venable = Vin, Cin = 1.0 mF, Cout = 1.0 mF, TJ = 25°C, unless
otherwise noted.)
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage (TA = 25°C, Iout = 10 mA)
1.5 V
1.8 V
2.5 V
2.7 V
2.8 V
3.0 V
3.1 V
3.3 V
5.0 V
Vout
V
1.455
1.5
1.545
1.746
1.8
1.854
2.425
2.5
2.575
2.646
2.7
2.754
2.744
2.8
2.856
2.94
3.0
3.06
3.038
3.1
3.162
3.234
3.3
3.366
4.900
5.0
5.100
Output Voltage (TA = −40°C to 85°C, Iout = 10 mA)
1.5 V
1.8 V
2.5 V
2.7 V
2.8 V
3.0 V
3.1 V
3.3 V
5.0 V
Vout
V
1.455
1.5
1.545
1.746
1.8
1.854
2.425
2.5
2.575
2.619
2.7
2.781
2.716
2.8
2.884
2.910
3.0
3.09
3.007
3.1
3.193
3.201
3.3
3.399
4.900
5.0
5.100
Line Regulation (Iout = 10 mA)
1.5 V−4.4 V (Vin = Vout(nom.) + 1.0 V to 6.0 V)
4.5 V−5.0 V (Vin = 5.5 V to 6.0 V)
Load Regulation (Iout = 1.0 mA to 80 mA)
Output Current (Vout = (Vout at Iout = 80 mA) −3%)
1.5 V−3.9 V (Vin = Vout(nom.) + 2.0 V)
4.0 V−5.0 V (Vin = 6.0 V)
Dropout Voltage (TA = −40°C to 85°C, Iout = 80 mA,
Measured at Vout −3.0%)
1.5 V
1.8 V
2.5 V
2.7 V
2.8 V
3.0 V
3.1 V
3.3 V
5.0 V
Regline
−
−
Regload
−
Io(nom.)
80
80
Vin−Vout
−
−
−
−
−
−
−
−
mV/V
1.0
3.0
1.0
3.0
0.3
0.8
mV/mA
mA
200
−
200
−
mV
450
550
350
450
220
300
200
300
200
300
180
300
170
300
160
300
120
300
Quiescent Current (TA = −40°C to 85°C)
(Enable Input = 0 V)
(Enable Input = Vin, Iout = 1.0 mA to Io(nom.))
Output Short Circuit Current (Vout = 0 V)
1.5 V−3.9 V (Vin = Vout(nom.) + 2.0 V)
4.0 V−5.0 V (Vin = 6.0 V)
Output Voltage Noise (f = 100 Hz to 100 kHz)
Iout = 30 mA, Cout = 1 mF
Ripple Rejection (f = 1.0 kHz, 60 mA)
IQ
−
−
mA
0.1
1.0
40
90
Iout(max)
mA
150
250
400
150
250
400
Vn
mVrms
−
180
−
RR
−
50
−
dB
Enable Input Threshold Voltage
(Voltage Increasing, Output Turns On, Logic High)
(Voltage Decreasing, Output Turns Off, Logic Low)
Vth(en)
1.3
−
V
−
−
−
0.3
Output Voltage Temperature Coefficient
TC
−
"100
−
ppm/°C
3. Maximum package power dissipation limits must be observed.
PD
+
TJ(max) *TA
RqJA
4. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible.
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