NCV7380(2004) データシートの表示（PDF） - ON Semiconductor

部品番号

コンポーネント説明

メーカー

NCV7380
(Rev.:2004)

LIN Transceiver

ON Semiconductor 

NCV7380

ESD/EMC Remarks

General Remarks

Electronic semiconductor products are sensitive to

Electro Static Discharge (ESD). Always observe Electro

Static Discharge control procedures whenever handling

semiconductor products.

ESD Test

The NCV7380 is tested according to MIL883D (human

body model).

EMC

The test on EMC impacts is done according to ISO

7637−1 for power supply pins and ISO 7637−3 for data and

signal pins.

POWER SUPPLY PIN VS

Test Pulse

1

2

3a/b

5

Condition

t1 = 5.0 s/US = −100 V/tD = 2.0 ms

t1 = 0.5 s/US = 100 V/tD = 0.05 ms

US = −150 V/US = 100 V

Burst 100 ns/10 ms/90 ms Break

Ri = 0.5 W, tD = 400 ms

tr = 0.1 ms/UP + US = 40 V

Duration

5000 Pulses

5000 Pulses

1h

10 Pulses Every 1 Min

DATA AND SIGNAL PINS BUS

Test Pulse

1

2

3a/b

Condition

t1 = 5.0 s/US = −100 V/tD = 2.0 ms

t1 = 0.5 s/US = 100 V/tD = 0.05 ms

US = −150 V/US = 100 V

Burst 100 ns/10 ms/90 ms Break

Duration

1000 Pulses

1000 Pulses

1000 Burst

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