PC8240
Figure 24. Test Access Port Timing Diagram
TCK
TDI, TMS
12
TDO
13
TDO
10
11
INPUT VALID DATA
OUTPUT VALID DATA
Preparation for
Delivery
Packaging
Microcircuits are prepared for delivery in accordance with MIL-PRF-38535.
Certificate of Compliance Atmel offers a certificate of compliance with each shipment of parts, affirming the prod-
ucts are in compliance either with MIL-STD-883 and guaranteeing the parameters not
tested at temperature extremes for the entire temperature range.
Handling
MOS devices must be handled with certain precautions to avoid damage due to accu-
mulation of static charge. Input protection devices have been designed in the chip to
minimize the effect of this static buildup. However, the following handling practices are
recommended:
• Devices should be handled on benches with conductive and grounded surfaces.
• Ground test equipment, tools and operator.
• Do not handle devices by the leads.
• Store devices in conductive foam or carriers.
• Avoid use of plastic, rubber or silk in MOS areas.
• Maintain relative humidity above 50% if practical.
31
2149A–HIREL–05/02