S5L9250B データシートの表示（PDF） - Samsung

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S5L9250B

The CD-ROM 48X 1 chip receives the input signal read from the CD-DA/VIDEO-CD/CD-ROM disc after handling by the RF amplifier.

Samsung 

DATA SHEET

S5L9250B

¥¹¥±. TEST MODE

1.1 BI9250X Test Mode Setting Conditions : Scan Enable Signal(PAD75)

Pin No. Pin Normal Normal Normal Nand soak_te

Name Intel Motorol Indir _Tree st

a

glue glue_ glue_ind BIST SCAN_ block_in block_m block_in srom_te sdac_te

_intel motorola ir MODE MODE tel otorola dir

st

st

P37 TEST1 L

L

L

L

L

L

L

L

H

H

H

H

H

H

H

P41 TEST2 L

L

L

L

H

H

H

H

L

L

L

L

H

H

H

P42 TEST3 L

L

H

H

L

L

H

H

L

L

H

H

L

L

H

P44 TEST4 L

H

L

H

L

H

L

H

L

H

L

H

L

H

L

1.2 S5L9250B Block Test Mode Setting Characteristics

BI9250X can be operated in various modes b adjusting the values of P37, P41, P42, P44, theTEST1, TEST2,

TEST3, TEST4. NORMAL INTEL, NORMAL MOTOROLA, and NORMAL INDIRECT MODE are modes used in

normal operation, which makes the MICOM I/F operate in INTEL MODE, MOTOROLA MODE, or INDIRECT

MODE. The remaining 6 modes are TEST modes, including NAND TREE TEST, OAK CORE TEST, SERVO

ROM TEST, ECC SRAM TEST (BIST), SCAN TEST MODE, BLOCK TEST MODE. You need to set the 4 test

pins according to the mode you want. Of the test modes above, Glue Test and block_test adjust TEST1, 2, 3, and

4 for respective use as Intel, Motorola, and Indirect mode.

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