SST29SF010 データシートの表示（PDF） - Silicon Storage Technology

部品番号

コンポーネント説明

メーカー

SST29SF010

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Small-Sector Flash

Silicon Storage Technology 

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Small-Sector Flash

SST29SF512 / SST29SF010 / SST29SF020 / SST29SF040

SST29VF512 / SST29VF010 / SST29VF020 / SST29VF040

Preliminary Specifications

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

505 ILL F11.0

AC test inputs are driven at VIHT (3.0 V) for a logic “1” and VILT (0 V) for a logic “0”. Measurement reference points for

inputs and outputs are VIT (1.5 VDD) and VOT (1.5 VDD). Input rise and fall times (10% ↔ 90%) are <10 ns.

FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29SFXXX

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

505 ILL F11.0

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

FIGURE 14: AC INPUT/OUTPUT REFERENCE WAVEFORMS FOR SST29VFXXX

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

TEST LOAD EXAMPLE FOR SST29SF512/010/020/040

TO TESTER

CL

RL LOW

VDD

RL HIGH

TEST LOAD EXAMPLE FOR SST29VF512/010/020/040

TO TESTER

TO DUT

CL

505 ILL F12b.2

FIGURE 15: TEST LOAD EXAMPLES

©2001 Silicon Storage Technology, Inc.

505 ILL F12.2

16

S71160-05-000 5/01 505

Share Link: