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TSA1002CF(2000) データシートの表示(PDF) - STMicroelectronics

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TSA1002CF
(Rev.:2000)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
TSA1002CF Datasheet PDF : 19 Pages
First Prev 11 12 13 14 15 16 17 18 19
TSA1002
capacitance, buffers or latches close to the output
pins will relax this constraint.
- Choose component sizes as small as possible
(SMD).
EVAL1002 evaluation board
The characterization of the board has been made
with a fully ADC devoted test bench as shown on
Figure 10. The analog signal must be filtered to be
very pure.
The dataready signal is the acquisition clock of the
logic analyzer.
The ADC digital outputs are latched by the octal
buffers 74LCX573.
All characterization measurements have been
made with:
SFSR=+0.2dB for static parameters.-
SFSR=-0.5dB for dynamic parameters.
Figure 10 : Analog to Digital Converter characterization bench
Power
HP8644B
Sine wave
Generator
Vin
ADC
data
evaluation
Logic
board
Analyzer
dataready
ck
HP8133A
Pulse
Generator
TLA704
Sine Wave
HP8644B Generator
16/19

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