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HA2-5102/883 データシートの表示(PDF) - Intersil

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HA2-5102/883 Datasheet PDF : 5 Pages
1 2 3 4 5
Specifications HA-5102/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: VSUPPLY = ±15V, RLOAD = 2k, CLOAD = 50pF, AVCL = 1V/V, Unless Otherwise Specified.
LIMITS
PARAMETERS
Differential Input
Resistance
Input Noise Voltage
Density
Input Noise Current
Density
Full Power
Bandwidth
Minimum Closed Loop
Stable Gain
Output Resistance
Quiescent Power
Consumption
Channel Separation
SYMBOL
RIN
CONDITIONS
VCM = 0V
EN
IN
FPBW
RS = 20,
fO = 1000Hz
RS = 2M,
fO = 1000Hz
VPEAK = 10V
CLSG RL = 2k, CL = 50pF
ROUT
PC
CS
Open Loop
VOUT = 0V, IOUT =
0mA
RS = 1k,
AVCL = 100V/V,
VIN = 100mVPEAK at
10kHz Referred to
Input
NOTES
1
1
1
1, 2
1
1
1, 3
1
TEMPERATURE MIN
+25oC
250
+25oC
-
+25oC
-
+25oC
16
-55oC to +125oC
+1
+25oC
-
-55oC to +125oC
-
+25oC
60
MAX
-
UNITS
k
6
nV/√Hz
3
pA/√Hz
-
kHz
-
V/V
360
180
mW
-
dB
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These pa-
rameters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characteriza-
tion based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.).
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)
1
Final Electrical Test Parameters
1 (Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only.
Spec Number 511019-883
112

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