5962-9669001HUA データシートの表示（PDF） - Austin Semiconductor

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5962-9669001HUA

128K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY

Austin Semiconductor 

Austin Semiconductor, Inc.

FLASH

AS29F010

FIGURE 7: TEST CONDITIONS,

Test Setup

TABLE 6: TEST CONDITIONS,

Test Specifications

CONDITIONS

Output Load

ALL SPEEDS UNIT

1 TTL Gate

Output Load Capacitance, CL

50

pF

(including jig capacitance)

Input Rise and Fall Times

5

ns

Input Pulse Levels

0/3

V

Input timing measurement

reference levels

1.5

V

Output timing measurement

reference levels

1.5

V

AC CHARACTERISTICS: Read-Only Operations

PARAMETER

Read Cycle Time1

SYMBOL

JEDEC Std

tAVAV tRC

TEST SETUP

-50

MIN 50

Address to Output Delay

tAVQV tACC

CE\ = VIL

OE\ = VIL

MAX 50

Chip Enable to Output Delay

tELQV tCE OE\ = VIL MAX 50

Output Enable to Output Delay

Chip Enable to Output High Z1

Output Enable to Output High Z1

tGLQV tOE

tEHQZ tDF

tGHQZ tDF

MAX 25

MAX 15

MAX 15

Output Enable Hold Time1

Read

MIN

tOEH Toggle and

Data Polling

MIN

Output Hold Time From Addresses

CE\ or OE\, Whichever Occurs

tAXQX tOH

MIN

First

SPEED OPTIONS

-60 -70 90 -120 -150 UNITS

60 70 90 120 150 ns

60 70 90 120 150 ns

60 70 90 120 150 ns

30 35 40 50 55 ns

20 20 25 30 35 ns

20 20 25 30 35 ns

0

ns

10

ns

0

ns

NOTES:

1. Not 100% tested.

2. See Figure 7 and Table 6 for test specifications.

AS29F010

Rev. 2.3 12/08

14

Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

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