MACH435-12 データシートの表示（PDF） - Lattice Semiconductor

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MACH435-12

High-Density EE CMOS Programmable Logic

Lattice Semiconductor 

ABSOLUTE MAXIMUM RATINGS

Storage Temperature . . . . . . . . . . . –65°C to +150°C

Ambient Temperature

with Power Applied . . . . . . . . . . . . . –55°C to +125°C

Supply Voltage with

Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V

DC Input Voltage . . . . . . . . . . . . –0.5 V to VCC +0.5 V

DC Output or

I/O Pin Voltage . . . . . . . . . . . . . –0.5 V to VCC +0.5 V

Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V

Latchup Current (TA = 0°C to +70°C) . . . . . . 200 mA

Stresses above those listed under Absolute Maximum Ratings

may cause permanent device failure. Functionality at or above

these limits is not implied. Exposure to Absolute Maximum

Ratings for extended periods may affect device reliability.

Programming conditions may differ.

OPERATING RANGES

Commercial (C) Devices

Temperature (TA) Operating

in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C

Supply Voltage (VCC) with

Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V

Operating ranges define those limits between which the func-

tionality of the device is guaranteed.

DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified

Parameter

Symbol

Parameter Description

Test Conditions

Min

Typ Max Unit

VOH

Output HIGH Voltage

IOH = –3.2 mA, VCC = Min

2.4

V

VIN = VIH or VIL

VOL

Output LOW Voltage

IOL = 24 mA, VCC = Min

VIN = VIH or VIL (Note 1)

0.5 V

VIH

Input HIGH Voltage

Guaranteed Input Logical HIGH

2.0

V

Voltage for all Inputs (Note 2)

VIL

Input LOW Voltage

Guaranteed Input Logical LOW

Voltage for all Inputs (Note 2)

0.8 V

IIH

Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 3)

10 µA

IIL

Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 3)

–100 µA

IOZH

Off-State Output Leakage

VOUT = 5.25 V, VCC = Max

Current HIGH

VIN = VIH or VIL (Note 3)

10 µA

IOZL

Off-State Output Leakage

VOUT = 0 V, VCC = Max

Current LOW

VIN = VIH or VIL (Note 3)

–100 µA

ISC

Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 4)

–30

–160 mA

ICC

Supply Current

VIN = 0 V, Outputs Open

(IOUT = 0 mA), VCC = 5.0 V,

f =25 MHz, TA = 25°C (Note 5)

255

mA

CAPACITANCE (Note 6)

Parameter

Symbol

Parameter Description

Test Conditions

Typ Unit

CIN

Input Capacitance

VIN = 2.0 V

VCC = 5.0 V, TA = 25°C,

6

pF

COUT

Output Capacitance

VOUT = 2.0 V f = 1 MHz

8

pF

Notes:

1. Total IOL for one PAL block should not exceed 128 mA.

2. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.

3. I/O pin leakage is the worst case of IIL and IOZL(or IIH and IOZH).

4. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.

VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.

5. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL Block and capable of being loaded,

enabled, and reset. An actual ICCvalue can be calculated by using the “Typical Dynamic ICCCharacteristics” Chart towards the

end of this data sheet.

6. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified

where capacitance may be affected.

MACH435-15/20 (Com’l)

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