DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

E28F010-90 データシートの表示(PDF) - Intel

部品番号
コンポーネント説明
メーカー
E28F010-90 Datasheet PDF : 33 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
E
28F010
3.0 DESIGN CONSIDERATIONS
3.1 Two-Line Output Control
Flash memories are often used in larger memory
arrays. Intel provides two read control inputs to
accommodate multiple memory connections. Two-
line control provides for:
a. the lowest possible memory power dissipation
and,
b. complete assurance that output bus contention
will not occur.
To efficiently use these two control inputs, an
address decoder output should drive chip-enable,
while the system’s read signal controls all flash
memories and other parallel memories. This
assures that only enabled memory devices have
active outputs, while deselected devices maintain
the low power standby condition.
3.2 Power Supply Decoupling
Flash memory power-switching characteristics
require careful device decoupling. System
designers are interested in three supply current
(ICC) issues—standby, active, and transient current
peaks produced by falling and rising edges of chip-
enable. The capacitive and inductive loads on the
device outputs determine the magnitudes of these
peaks.
Two-line control and proper decoupling capacitor
selection will suppress transient voltage peaks.
Each device should have a 0.1 µF ceramic
capacitor connected between VCC and VSS, and
between VPP and VSS.
Place the high-frequency, low-inherent inductance
capacitors as close as possible to the devices.
Also, for every eight devices, a 4.7 µF electrolytic
capacitor should be placed at the array's power
supply connection, between VCC and VSS. The bulk
capacitor will overcome voltage slumps caused by
printed circuit board trace inductance, and will
supply charge to the smaller capacitors as needed.
3.3 VPP Trace on Printed Circuit
Boards
Programming flash memories, while they reside in
the target system, requires that the printed circuit
board designer pay attention to the VPP power
supply trace. The VPP pin supplies the memory cell
current for programming. Use similar trace widths
and layout considerations given the VCC power bus.
Adequate VPP supply traces and decoupling will
decrease VPP voltage spikes and overshoots.
3.4 Power-Up/Down Protection
The 28F010 is designed to offer protection against
accidental erasure or programming during power
transitions. Upon power-up, the 28F010 is
indifferent as to which power supply, VPP or VCC,
powers up first. Power supply sequencing is not
required. Internal circuitry in the 28F010 ensures
that the command register is reset to the read mode
on power-up.
A system designer must guard against active writes
for VCC voltages above VLKO when VPP is active.
Since both WE# and CE# must be low for a
command write, driving either to VIH will inhibit
writes. The control register architecture provides an
added level of protection since alteration of memory
contents only occurs after successful completion of
the two-step command sequences.
3.5 28F010 Power Dissipation
When designing portable systems, designers must
consider battery power consumption not only during
device operation, but also for data retention during
system idle time. Flash nonvolatility increases the
usable battery life of your system because the
28F010 does not consume any power to retain
code or data when the system is off. Table 4
illustrates the power dissipated when updating the
28F010.
16

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]