SCC2681 データシートの表示（PDF） - NXP Semiconductors.
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SCC2681 Datasheet PDF : 29 Pages
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Philips Semiconductors
Dual asynchronous receiver/transmitter (DUART)
Product data
SCC2681
ABSOLUTE MAXIMUM RATINGS1
SYMBOL
Tamb
Tstg
PARAMETER
Operating ambient temperature range2
Storage temperature range
All voltages with respect to ground3
RATING
See Note 4
–65 to +150
–0.5 to +6.0
UNIT
°C
°C
V
Pin voltage range
VSS – 0.5 V to VCC + 0.5 V
V
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other condition above those indicated in the operation section of this specification is not
implied.
2. For operating at elevated temperatures, the device must be derated based on +150 °C maximum junction temperature.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
4. Parameters are valid over specified temperature range. See Ordering information table for applicable operating temperature range and VCC
supply range.
DC ELECTRICAL CHARACTERISTICS1, 2, 3
Tamb = –40 °C to +85 °C; VCC = +5.0 V ± 10%
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
Min
Typ
UNIT
Max
VIL
LOW-level input voltage
VIH
HIGH-level input voltage (except X1/CLK)
VIH
HIGH-level input voltage (except X1/CLK)
VIH
HIGH-level input voltage (X1/CLK)
Tamb ≥ 0 °C
Tamb < 0 °C
–
–
0.8
V
2.0
–
–
V
2.5
–
–
V
0.8 VCC
–
–
V
VOL
LOW-level output voltage
VOH
HIGH-level output voltage (except open-drain outputs)4
IOL = 2.4 mA
IOH = –400 µA
–
–
0.4
V
VCC – 0.5 –
–
V
IIX1
IILX1
IIHX1
X1/CLK input current
X1/CLK input LOW current – operating
X1/CLK input HIGH current – operating
VIN = 0 V to VCC
VIN = 0 V
VIN = VCC
–10
–
+10 µA
–75
–
0
µA
0
–
75
µA
IOHX2
IOHX2S
IOLX2
IOLX2S
II
IOZH
IOZL
IODL
IODH
ICC
X2 output HIGH current – operating
X2 output HIGH short circuit current – operating
X2 output LOW current – operating
X2 output LOW short circuit current – operating
Input leakage current:
All except input port pins
Input port pins
Output off current HIGH, 3-state data bus
Output off current LOW, 3-state data bus
Open-drain output LOW current in off-state
Open-drain output HIGH current in off-state
Power supply current5
Operating mode
VOUT = VCC; X1 = 0
0
VOUT = 0 V; X1 = 0
–10
VOUT = 0 V; X1 = VCC
–75
VOUT = VCC; X1 = VCC
1
VIN = 0 V to VCC
–10
VIN = 0 V to VCC
–20
VIN = VCC
–
VIN = 0 V
–10
VIN = 0 V
–10
VIN = VCC
–
CMOS input levels
–
–
+75 µA
–
–1 mA
–
0
µA
–
10 mA
–
+10 µA
–
+10 µA
–
10
µA
–
–
µA
–
–
µA
–
10
µA
–
10 mA
NOTES:
1. Parameters are valid over specified temperature range.
2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4 V and 2.4 V with a transition time of
5 ns maximum. For X1/CLK this swing is between 0.4 V and 4.4 V. All time measurements are referenced at input voltages of 0.8 V and
2.0 V and output voltages of 0.8 V and 2.0 V, as appropriate.
3. Typical values are at +25 °C, typical supply voltages, and typical processing parameters.
4. Test conditions for outputs: CL = 150 pF, except interrupt outputs. Test conditions for interrupt outputs: CL = 50 pF, RL = 2.7 kΩ to VCC.
5. All outputs are disconnected. Inputs are switching between CMOS levels of VCC – 0.2 V and VSS + 0.2 V.
2004 Apr 06
5
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