AD9940BCPZ(Rev0) データシートの表示（PDF） - Analog Devices

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AD9940BCPZ
(Rev.:Rev0)

High Speed, Correlated Double Sampler with Integrated Timing Driver

Analog Devices 

AD9940

ABSOLUTE MAXIMUM RATINGS

Table 5.

Parameter

Rating

AVDD and TCVDD to AVSS

−0.3 V to +3.9 V

HVDD and RGVDD to HVSS and

RGVSS

−0.3 V to +3.9 V

DVDD and OVDD to DVSS and OVSS −0.3 V to +3.9 V

Any VSS to Any VSS

−0.3 V to +0.3 V

CLPOB/HBLK to DVSS

−0.3 V to DVDD + 0.3 V

SCK, SL, and SDI to DVSS

−0.3 V to DVDD + 0.3 V

RG to RGVSS

−0.3 V to RGVDD + 0.3 V

H1–H4 to HVSS

−0.3 V to HVDD + 0.3 V

REFT, REFB, and CCDIN to AVSS

−0.3 V to AVDD + 0.3 V

Junction Temperature

150°C

Lead Temperature (10 sec)

350°C

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those listed in the operational sections

of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

THERMAL CHARACTERISTICS

θJA is measured using a 4-layer PCB with the exposed paddle

soldered to the board.

Thermal resistance for 48-lead LQFP package:

θJA = 92°C/W

Thermal resistance for 48-lead LFCSP package:

θJA = 24°C/W1

1 θJA is measured using a 4-layer PCB with the exposed paddle

soldered to the board.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on

the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance

degradation or loss of functionality.

Rev. 0 | Page 6 of 20

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