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FXAS21002CQR1 データシートの表示(PDF) - Freescale Semiconductor

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FXAS21002CQR1
Freescale
Freescale Semiconductor Freescale
FXAS21002CQR1 Datasheet PDF : 58 Pages
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Revision History
Revision
number
Revision
date
2.0
2/2015
Description
• Updated Electrical Charactristics table, for Supply current drain in Standby mode, and
Supply current drain in Standby mode over Temperature parameters. Also removed
test condition on Output Data Rate frequency tolerance parameter.
• Changed Table 8 Serial interface pin descriptions, pin currently named SDA/MOSI/
SPI_Data and modified pin description.
• changed Table 9, Slave timing values, for parameter SDA and SCL fall time, minimum
values for I2C Fast Mode.
• Added table title to Table 10. I2C Register Data Address Map.
• Section 3.1.1, I²C Operation, changed first paragraph to read “External pull-up resistors
connected to VDDIO”...
• Section 5, functionality, changed seventh bullet to read “Embedded rate threshold
detection function with programmable debounce time”
• Added new column “Auto-Increment Address” to Table 13 Register address map and
populated the column with data. Removed last two rows of table, Auto-Increment
address and Fast-read increment address.
• Modified note after Table 19 to read “After this register is read, the next read register by
the autoincrement process is STATUS at 0x00, when CTRL_REG3[WRAPTOONE] = 0,
or OUT_X_MSB when CTRL_REG3[WRAPTOONE] = 1.”
• Moved Section 2.1 to 2.5
• Figure 12, changed "SPI_DIO" to "SPI_DATA"
• Register 0x09: F_SETUP, added "The contents should only be modified when the
device is in Standby mode."
• Table 29, Field 1, changed "...XRT, YRT or ZRT..." to "...XRT, YRT and ZRT..."
• Register 0x0E: RT_CFG, added "The internal state of the Rate Threshold function is
reset when..."
• Table 37, Field 3, deleted second and third bullet
• Register 0x0F: RT_SRC, added "The content of this register is reset upon a transition
from Standy to Active or from Ready to Active modes.
• Table 39:
Field 6
• added "only if it has been latched (ELE =1)"
• added to bit 1 "(XRT, YRT or ZRT)"
Field 5
• changed second bullet to "Flag is asserted few samples (RT_COUNT)..."
• added third bullet "Cleared when the absolute value of Z..."
• changed bit 0 from "Z rate lower than RT_THS value" to "No rate threshold event
detected on Z-axis"
• changed bit 1 from "Z rate greater than RT_THS event has occured" to "Rate
Threshold event detected on Z axis"
Field 4
• changed first bullet from "Indicates the rate polarity on the Z-axis (if ZTEFE =1). If
ZTEFE =1, this bit indicates the polarity of the Z data irrespective of the rate
threshold event detected on Z-axis." to "Indicates the rate polarity on the Z-axis (if
RT_CFG[ZTEFE] =1). If RT_CFG[ZTEFE] =1, this bit indicates the polarity of the
Z data irrespective of the rate threshold event detected on Z-axis."
Field 3
• changed second bullet to "Flag is asserted few samples (RT_COUNT)..."
• added third bullet "Cleared when the absolute value of Y..."
• changed bit 0 from "Y rate lower than RT_THS value" to "No rate threshold event
detected on Y-axis"
• changed bit 1 from "Y rate greater than RT_THS event has occured" to "Rate
Threshold event detected on Y-axis"
Field 2
Table continues on the next page...
56
Freescale Semiconductor, Inc.
3-Axis Digital Angular Rate Gyroscope, Rev. 2.1, 5/2015

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