STK581U3C2D データシートの表示（PDF） - ON Semiconductor
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STK581U3C2D Datasheet PDF : 15 Pages
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STK581U3C2D−E
Test Circuits
(The tested phase : U+ shows the upper side of the U phase
and U− shows the lower side of the U phase.)
• ICE / IR(BD)
U+ V+ W+ U− V− W−
M
10 10 10
2
5
8
N
2
5
8
12 12 12
U(DB) V(DB) W(DB)
M
1
4
7
N
22
22
22
• VCE(SAT) (Test by pulse)
U+ V+ W+ U− V− W−
M
10 10 10
2
6
8
N
2
5
8
12 12 12
m
13 14 15 16 17 18
Figure 2. Test Circuit for ICE
• VF (Test by pulse)
U+ V+ W+ U− V− W−
M
10 10 10
2
5
8
N
2
5
8
12 12 12
• ID
M
N
VD1
VD2
VD3
VD4
1
4
7
21
2
5
8
22
Figure 3. Test Circuit for VCE(sat)
Figure 4. Test Circuit for VF
Figure 5. Test Circuit for ID
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