MITSUBISHI <CONTROL / DRIVER IC>
M54124L
EARTH LEAKAGE CURRENT DETECTOR
TEST CIRCUIT (CMA = 0.1µF, CMB = 0.1µF, RIN = 100Ω, Diode are equivalent to MD234, unless otherwise noted)
1
2
3
VR IN GND OD MA MB OS VS
12345 678
VIN
RIN
CMB
IS
A
VS
VR IN GND OD MA MB OS VS
12345 678
VIN
RIN
CMA CMB
VS
VOS
∗ VT is the value of VIN at which OS turns on
(VOS > 0.4V) as VIN is increased gradually.
VR IN GND OD MA MB OS VS
12345678
VIN
RIN
CMB
VS
A
IODL
VOD
IODH
4
5
6
VR IN GND OD MA MB OS VS
12345678
VIN
RIN
VMA
VMA
VS
VMB
VMAH
VMAL
VMB
7
0.4V
VR IN GND OD MA MB OS VS
12345 678
VIN
RIN
CMA
VS
A
IMBL
VMB
IMBH
8
VR IN GND OD MA MB OS VS
12345 678
VIN
RIN
CMA CMB
VS
A
IOSL IOSH
VOS
9
VR IN GND OD MA MB OS VS
12345 678
RIN
CMA CMB
VR IN GND OD MA MB OS VS
12345678
IS
V
V VINC
VSM
IIN IIN
VR IN GND OD MA MB OS VS
12345678
RIN
CMA CMB
VS
IVR
V VRCL
10
11
VR IN GND OD MA MB OS VS
12345 678
RIN
VIN
CMA
VS
VMB
VIN
1.85V
VMB
tCO
tMA
1.45V
0.4V
VR IN GND OD MA MB OS VS
12345678
RIN
CMA CMB
VS
VIN
VOS
∗tMB = tMB' -tMA
VIN
1.85V
1.45V
VOS
tOS
tMB'
0.4V