RH1013M データシートの表示（PDF） - Analog Devices
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RH1013M Datasheet PDF : 6 Pages
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RH1013M
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation)
VS = ±15V, VCM = 0V, TA = 25°C, unless otherwise noted.
SYMBOL PARAMETER
CONDITIONS
10KRAD (Si) 20KRAD (Si) 50KRAD (Si) 100KRAD (Si) 200KRAD (Si)
NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
VOS
Input Offset Voltage
450
450
600
750
900
µV
2
600
600
750
900
µV
IOS
Input Offset Current
10
10
15
20
25
nA
2
10
10
15
20
nA
IB
Input Bias Current
60
75
100
175
250
nA
2
80
100
125
200
nA
Input Voltage Range
1 13.5
13.5
13.5
13.5
13.5
V
1 –15.0
–15.0
–15.0
–15.0
–15.0
V
2 3.5
3.5
3.5
3.5
V
2
0
0
0
0
V
CMRR Common-Mode
Rejection Ratio
VCM = 13V, – 15V
97
97
94
90
86
dB
PSRR Power Supply
Rejection Ratio
VS = ± 10V to ±18V
100
98
94
86
80 dB
AVOL Large-Signal
Voltage Gain
RL ≥ 10k, VO = ±10V
500
200
100
50
25
V/mV
VOUT Maximum Output RL ≥ 10k
±12.5
±12.5
±12.5
±12.5
±12.5
V
Voltage Swing
Output Low, No Load
2
25
30
40
50
mV
Output Low, 600Ω to GND 2
10
10
10
10
mV
Output Low, ISINK = 1mA
2
0.6
0.8
1.0
1.6
V
Output High, No Load
2 4.0
4.0
4.0
4.0
V
Output High, 600Ω to GND 2 3.4
3.2
3.0
2.8
V
SR
Slew Rate
RL ≥ 10k
IS
Supply Current
Per Amplifier
0.13
0.12
0.11
0.07
0.01
V/µs
0.55
0.55
0.55
0.55
0.55 mA
2
0.50
0.50
0.50
0.50
mA
Note 1: Guaranteed by design, characterization, or correlation to other
tested parameters.
Note 2: Specification applies for VS+ = 5V, VS– = 0V, VCM = 0V,
VOUT = 1.4V.
TABLE 2: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUP
Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6
Group A Test Requirements (Method 5005)
1,2,3,4,5,6
Group B and D for Class S, and
1,2,3
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA applies to subgroup 1. See PDA Test Notes.
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Analog Devices, Inc. reserves the right to test to tighter limits than those
given.
Rev. F
For more information www.analog.com
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