MJE5740G データシートの表示（PDF） - ON Semiconductor
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MJE5740G Datasheet PDF : 6 Pages
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MJE5740, MJE5742
Table 1. Test Conditions for Dynamic Performance
REVERSE BIAS SAFE OPERATING AREA AND INDUCTIVE SWITCHING
RESISTIVE
SWITCHING
PW
DUTY CYCLE ≤ 10% 68
tr, tf ≤ 10 ns
+5 V
1N493 33
3
MJE21
0.001 mF
0
33 1N493
3
2N222
1
2
RB
k
1
IB
+5 Vk
VCC
L
IC
1N493
NOTE:
3
0.02 mF 270
PW and VCC Adjusted for Desired IC
RB Adjusted for Desired IB1
1
k 2N2905
47 100
1/2
W
T.U.T.
MJE20
0
− VBE(off)
MR826
*
Vclamp
*SELECTED FOR ≥ 1 kV
5.1
k VCE
51
+VCC
RC
TUT
RB
SCOPE
D
1
−4 V
COIL DATA:
FERROXCUBE CORE #6656
FULL BOBBIN (~16 TURNS) #16
GAP FOR 200 mH/20 A
Lcoil = 200 mH
VCC = 30 V
VCE(pk) = 250 Vdc
IC(pk) = 6 A
VCC = 250 V
D1 = 1N5820 OR EQUIV.
OUTPUT WAVEFORMS
IC
IC(pk)
tf
CLAMPED
t
t1
tf
VCE
VCE OR
Vclamp
t
TIM-
t2
E
t1 ADJUSTED TO
OBTAIN IC
t1 ≈
Lcoil (ICpk)
VCC
t2 ≈
Lcoil (ICpk)
Vclamp
TEST EQUIPMENT
SCOPE−TEKTRONICS
475 OR EQUIVALENT
+10 V
25 ms
0
− 9.2 V
tr, tf < 10 ns
DUTY CYCLE = 1%
RB AND RC ADJUSTED
FOR DESIRED IB AND IC
1.8
1.6
hFE = 20
1.4
1.2
1
−55 °C
0.8
+25 °C
0.6
+150°C
0.4
0.2
0.1
0.2
0.5
1
2
5
10
IC, COLLECTOR CURRENT (AMPS)
Figure 5. Inductive Switching Measurements
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4
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