M28C64X データシートの表示（PDF） - STMicroelectronics
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M28C64X Datasheet PDF : 15 Pages
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M28C64C, M28C64X
Table 4. AC Measurement Conditions
Input Rise and Fall Times
≤ 20ns
Input Pulse Voltages
0.4V to 2.4V
Input and Output Timing Ref. Voltages 0.8V to 2.0V
Note that Output Hi-Z is defined as the point where data is no
longer driven.
Figure 5. AC Testing Input Output Waveforms
2.4V
0.4V
2.0V
0.8V
AI00826
Figure 6. AC Testing Equivalent Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF
CL includes JIG capacitance
AI01129
Table 5. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 6. Read Mode DC Characteristics (TA = 0 to 70°C or –40 to 85°C, VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
Min
Max
Unit
ILI
ILO
ICC (1)
ICC1 (1)
ICC2 (1)
Input Leakage Current
Output Leakage Current
Supply Current (TTL and CMOS inputs)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
0V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VCC
E = VIL, G = VIL , f = 5 MHz
E = VIH
E > VCC –0.3V
10
µA
10
µA
30
mA
2
mA
100
µA
VIL
Input Low Voltage
– 0.3
0.8
V
VIH
Input High Voltage
2
VCC +0.5
V
VOL Output Low Voltage
VOH Output High Voltage
Note: 1. All I/O’s open circuit.
IOL = 2.1 mA
IOH = –400 µA
0.4
V
2.4
V
Table 7. Power Up Timing (1) (TA = 0 to 70°C or –40 to 85°C, VCC = 4.5V to 5.5V)
Symbol
Parameter
Min
Max
Unit
tPUR
Time Delay to Read Operation
1
µs
tPUW
Time Delay to Write Operation
Note: 1. Sampled only, not 100% tested.
10
ms
5/15
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