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M54HC243F1R データシートの表示(PDF) - STMicroelectronics

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M54HC243F1R
ST-Microelectronics
STMicroelectronics ST-Microelectronics
M54HC243F1R Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
M54/M74HC242/243
TEST CIRCUIT ICC (Opr.)
CCP CALCULATION
CPD is to be calculated with the following formula
by using the measured value of ICC (Opr.) in the
test circuit opposite
CPD
=
ICC
fIN
(Opr.)
x VCC
In determining the typical value of CPD, a
relatively high frequency of 1MHz was applied to
fIN, in order to eliminate any error caused by the
quiescent supply current.
6/11

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