MC100E107 データシートの表示（PDF） - ON Semiconductor

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MC100E107

5VECL Quint 2-Input XOR/XNOR Gate

ON Semiconductor 

MC10E107, MC100E107

Table 8. AC CHARACTERISTICS VCCx= 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)

−40°C

25°C

Symbol

fMAX

tPLH

tPHL

Characteristic

Maximum Toggle Frequency

Propagation Delay to Output

Min Typ Max Min Typ Max Min

700

700

D to Q 250

D to F 500

410 600 250

725 1000 500

410 600 250

725 1000 500

tSKEW Within-Device Skew (Note 10)

D to Q

75

75

tJITTER

tr

tf

Random Clock Jitter (RMS)

Rise/Fall Time

(20 - 80%)

<1

<1

Q 275 450 700 275 450 700 275

F 300 475 700 300 475 700 300

85°C

Typ

700

410

725

75

<1

450

475

Max

600

1000

Unit

MHz

ps

ps

ps

ps

700

700

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

9. 10 Series: VEE can vary −0.46 V / +0.06 V.

100 Series: VEE can vary −0.46 V / +0.8 V.

10. Within-device skew is defined as identical transitions on similar paths through a device.

Q

Driver

Device

Q

Zo = 50 W

Zo = 50 W

50 W

50 W

D

Receiver

Device

D

VTT

VTT = VCC − 2.0 V

Figure 3. Typical Termination for Output Driver and Device Evaluation

(See Application Note AND8020/D − Termination of ECL Logic Devices.)

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