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HS-139RH-T データシートの表示(PDF) - Intersil

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HS-139RH-T Datasheet PDF : 2 Pages
1 2
Die Characteristics
DIE DIMENSIONS:
3750µm x 2820µm (148 mils x 111 mils)
483µm ± 25.4µm (19 mils ± 1 mil)
INTERFACE MATERIALS
Glassivation
Type: Nitride (Si3N4) over Silox (SiO2
Nitride Thickness: 4.0kA +/- 0.5kA
Silox Thickness: 12.0kA +/- 1.3kA
Top Metallization
Type: AL Si Cu
Thickness: 16.0kA +/- 2kA
Substrate:
Radiation Hardened Silicon Gate,
Dielectric Isolation
Metallization Mask Layout
OUT4
(13)
OUT3
(14)
OUT2
(1)
OUT1
(2)
HS-139RH-T
Backside Finish:
Silicon
ASSEMBLY RELATED INFORMATION
Substrate Potential:
Unbiased (DI)
ADDITIONAL INFORMATION
Worst Case Current Density:
<2.0 x 105 A/cm2
Transistor Count:
49
HS-139RH-T
GND +IN4
-IN4
(12)
(11)
(10)
V+
-IN1
(3)
(4)
+IN1
(5)
+IN3
(9)
-IN3
(8)
+IN2
(7)
-IN2
(6)
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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