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TP120N データシートの表示(PDF) - STMicroelectronics

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TP120N
ST-Microelectronics
STMicroelectronics ST-Microelectronics
TP120N Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
Characteristics
Figure 5.
Reference test circuit 1
Auto
Transformer
220 V / 2 A
tp = 20 ms
Static
relay
VOUT
K
IBO, IH
measure
R1
140 Ω
R2
240 Ω
D.U.T.
VBO
measure
Transformer
220 V / 800 V
2A
TEST PROCEDURE
Pulse test duration (tp = 20 ms):
for Bidirectional devices = Switch K is closed
for Unidirectional devices = Switch K is open
VOUT selection:
Device with VBO < 200 V VOUT = 250 VRMS, R1 = 140 Ω
Device with VBO > 200 V VOUT = 480 VRMS, R2 = 240 Ω
Figure 6. Functional holding current (IH) test circuit 2
R
VBAT = - 48 V
D.U.T.
- VP
Surge generator
TPI
This is a GO-NOGO test which allows to confirm the holding current (IH) level in a
functional test circuit.
TEST PROCEDURE
1/ Adjust the current level at the IH value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current IPP 10 A, 10/1000 µs.
3/ The D.U.T. will come back off-state within 50 ms maximum.
4/9

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